The Laboratory of Advance Technology (LTA) in Geneva has launched a new platform for chemical analysis and imaging. Open to both academics and industry, this platform provides access to a nano-TOF SIMS and an XPS, and is the only lab in Switzerland to provide access to both of these complementary techniques. Together, they…
A new single-crystal X-ray diffractometer was installed in the Laboratory of Crystallography at UNIGE. This dual micro-focus source diffractometer (Mo, Cu) is equipped with a new generation curved photon counting X-ray detector (RIGAKU Hypix arc 150), allowing very fast measurements since more data are collected in a single exposure. The detector has almost zero noise,…
This platform is now open to both academic and industrial laboratories. Discover more at the XPS and TOF-SIMS seminar on November 14th. This platform, unique in Switzerland, combines expertise in molecular identification and surface chemistry with two state-of-the-art systems: a TOF-SIMS mass spectrometer and a scanning XPS microprobe. These two complementary techniques allow sensitive and…
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